YT-2230 Synthetic Quartz Tube — Semiconductor-Grade Fused Silica Tube (SiO₂ ≥99.9999%)
LUMIGLAS® YT-2230 is a semiconductor-grade synthetic quartz tube manufactured from ultra-high purity fused silica (SiO₂ ≥99.9999%). All major metallic impurities are controlled below 0.005 ppm (wt), making it suitable for diffusion furnaces, CVD process chambers, LPCVD reaction tubes and quartz boat holders in silicon wafer fabrication. Available OD range ≤10 mm to 60–90 mm; lengths to 3000 mm. Custom dimensions and precision grades on request.
Description
The LUMIGLAS® YT-2230 synthetic quartz tube is an ultra-high purity fused silica process tube engineered for semiconductor diffusion furnaces, CVD and LPCVD reaction chambers, and other process equipment where metallic contamination and dimensional variability must be controlled to the tightest tolerances. Manufactured from synthetic fused silica with SiO₂ purity ≥99.9999%, the YT-2230 controls all ten major metallic impurity elements to below 0.005 ppm (wt) — meeting the contamination requirements of advanced silicon wafer fabrication processes.
Because semiconductor process yield is directly affected by trace metallic contamination from quartz components, engineers specify the YT-2230 wherever a high-purity quartz tube must combine ultra-low impurity content with precise OD/WT tolerances and a stringent bubble inclusion standard. Available in outer diameters from ≤10 mm to the 60–90 mm range with lengths up to 3000 mm, the YT-2230 covers the majority of standard diffusion tube and process tube sizes. Consequently, custom dimensions and precision grades are also available for specialised process requirements.
Technical Specifications — YT-2230 Synthetic Quartz Tube
| Parameter | Value / Grade |
|---|---|
| Product Type | Semiconductor-grade synthetic quartz tube (fused silica tube) |
| Material | Synthetic fused silica — SiO₂ ≥99.9999% (6N grade) |
| OH Content | Ultra-low hydroxyl (low-OH) grade |
| Metallic Impurities | All major elements (Li, Na, K, Mg, Ca, Cu, Al, Cr, Fe, Ti) <0.005 ppm (wt) |
| Max. Service Temperature | ~1200°C (continuous service) |
| Thermal Expansion | 0.55 × 10⁻⁶ /°C — near-zero thermal expansion |
| OD Range | ≤10 mm · 10–40 mm · 40–60 mm · 60–90 mm |
| Max. Length | Up to 3000 mm (OD range dependent) |
| Transparency | Clear / transparent grade |
| Material Certificate | Full impurity analysis Certificate of Conformity (CoC) supplied as standard |
Major Metallic Impurity Content — YT-2230
All values in ppm (wt). Full impurity analysis Certificate of Conformity (CoC) provided as standard with each order.
| Grade | Li | Na | K | Mg | Ca | Cu | Al | Cr | Fe | Ti |
|---|---|---|---|---|---|---|---|---|---|---|
| <0.005 ppm | <0.001 | <0.005 | <0.002 | <0.001 | <0.003 | <0.001 | <0.003 | <0.001 | <0.001 | <0.001 |
Geometric Specifications & Dimensional Tolerances
OD = outer diameter (mm) · WT = wall thickness (mm). Custom precision grades available on request.
| Parameter | Outer Diameter OD (mm) — Size Range | |||
|---|---|---|---|---|
| ≤10 | 10 – 40 | 40 – 60 | 60 – 90 | |
| OD range (mm) | ≤10 | 10–40 | 40–60 | 60–90 |
| WT (mm) | ≤1.5 | 1.0–10 | 2–15 | 2–30 |
| OD Tolerance (mm) | ±0.2 | ±0.50 | ±0.80 | ±2.00 |
| WT Tolerance (mm) | ±0.20 | ±0.30 | ±0.30 | ±3.00 |
| Out-of-Roundness (mm) | ≤0.08 | ≤0.15 | ≤0.40 | ≤0.40 |
| Wall Eccentricity (mm) | ≤0.08 | ≤0.15 | ≤0.45 | ≤0.45 |
| CSA Relative Difference | ≤3.0% | ≤6.0% | ≤6.0% | ≤6.0% |
| Bow (mm/m) | ≤0.40 | ≤0.70 | ≤0.70 | ≤0.70 |
| Length (mm) | ≤2000 | ≤3000 | ≤3000 | ≤2000 |
* Custom dimensions, tighter tolerances and special precision grades available on request. Provide OD × WT × Length (mm) when enquiring.
Optical Quality Standard — Bubble Inclusion Count
Maximum allowable bubble count per metre of tube length, by bubble diameter and wall thickness class.
| Bubble Diameter (mm) | Wall Thickness — Max. Allowable Count (no./m) | |||
|---|---|---|---|---|
| ≤3 mm | >3 – ≤10 mm | >10 – ≤25 mm | >25 mm | |
| >0.2 – ≤0.5 | 1 | 3 | 14 | 21 |
| >0.5 – ≤1.0 | 0 | 1 | 6 | 9 |
All bubbles characterised by width; length must not exceed 8 mm. Bubbles ≤0.2 mm not counted. *WT ≤3 mm: open bubbles not permitted. Inclusions >0.2 mm width not permitted. No visible surface defects to naked eye.
Why Specify YT-2230 for Semiconductor Process Equipment?
Trace metallic contamination from quartz components is a well-documented yield loss mechanism in semiconductor diffusion and CVD processes. Conventional fused quartz tubes sourced from natural quartz sand contain measurable levels of Li, Na, Al, Fe and other metallic impurities that can migrate into the silicon wafer stack at elevated process temperatures. In contrast, the YT-2230 uses synthetic fused silica produced by chemical vapour deposition — achieving SiO₂ purity of 99.9999% and controlling all major metallic impurities to sub-part-per-billion levels.
6N Purity — SiO₂ ≥99.9999%
Synthetic CVD-grade fused silica with all metallic contaminants controlled to <0.005 ppm — meeting the requirements of advanced node semiconductor process equipment.
Tight Dimensional Tolerances
OD tolerance ±0.2 mm (≤10 mm OD) to ±2.00 mm (60–90 mm OD), with out-of-roundness ≤0.08 mm for the smallest sizes — enabling reliable sealing and consistent furnace loading.
Near-Zero Thermal Expansion
Thermal expansion coefficient of 0.55 × 10⁻⁶ /°C — the quartz tube survives rapid thermal cycling from ambient to 1200°C without cracking or dimensional change.
Full Traceability
Full impurity analysis Certificate of Conformity (CoC) supplied with every order — essential for semiconductor equipment qualification and process documentation requirements.
Typical Applications
- ▸Semiconductor diffusion furnace process tubes — replacement for conventional fused quartz tubes in oxidation, LPCVD, annealing and doping furnaces
- ▸CVD and LPCVD reaction chamber components — liner tubes, injector tubes and susceptor sleeves requiring ultra-low metallic contamination
- ▸Quartz boat holders and protective sheaths — for silicon wafer boats in vertical and horizontal furnace configurations
- ▸Thermal oxidation and diffusion tubes — for boron and phosphorus doping processes in silicon wafer fabrication
- ▸High-purity laboratory and analytical instrument components — wherever sub-ppb metallic contamination control is required in quartz glassware
Technical Document & Download
📄 Technical Datasheet — YT-2230
Full impurity data, geometric tolerances, dimensional table and optical quality standard.
Frequently Asked Questions
Request a Quote — LUMIGLAS® YT-2230 Synthetic Quartz Tube
Specify: OD × WT × Length (mm) · Quantity · Precision grade · CoC required





